电子能量损失谱（英文：Electron energy loss spectroscopy，缩写EELS）是物理学及材料科学等研究领域的重要手段，该技术出现于1940年代。

将要研究的材料置于电子显微镜中，用一束动能分布很窄的电子轰击。一部分入射电子经历非弹性散射，其动能发生改变（通常是减小）。动能损失的机理有很多，包括：电子-声子相互作用, 带内或带间散射, 电子-等离子体相互作用, 内壳层电子电离, 及轫致辐射。电子的能量损失可以被电子谱仪定量的测量出来。内壳层电子电离引起的非弹性散射对于分析材料的元素构成尤为有用。比方说，碳原子的1s电子电离能为285eV。如果285eV的动能损失被探测到，则材料中一定存在碳元素。

In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their paths slightly and randomly deflected. The amount of energy loss can be measured via an electron spectrometer and interpreted in terms of what caused the energy loss. Inelastic interactions include phonon excitations, inter and intra band transitions, plasmon excitations, inner shell ionizations, and Cherenkov radiation. The inner-shell ionizations are particularly useful for detecting the elemental components of a material. For example, one might find that a larger-than-expected number of electrons comes through the material with 285 eV less energy than they had when they entered the material. This is approximately the amount of energy needed to remove an inner-shell electron from a carbon atom, which can be taken as evidence that there is a significant amount of carbon present in the sample. With some care, and looking at a wide range of energy losses, one can determine the types of atoms, and the numbers of atoms of each type, being struck by the beam. The scattering angle (that is, the amount that the electron's path is deflected) can also be measured, giving information about the dispersion relation of whatever material excitation caused the inelastic scattering.