Particle-induced X-ray emission
（重定向自PIXE）
Particle-induced X-ray emission or proton-induced X-ray emission (PIXE) is a technique used in the determining of the elemental make-up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the x-ray part of the electromagnetic spectrum specific to an element. PIXE is a powerful yet non-destructive elemental analysis technique now used routinely by geologists, archaeologists, art conservators and others to help answer questions of provenance, dating and authenticity.